此次活動能聚集行業(yè)領先公司一起分享降低成本戰(zhàn)略。 2008年4月28日消息，NI宣布舉行第五屆年度自動化測試峰會——以關(guān)注行業(yè)發(fā)展趨勢，克服挑戰(zhàn)為主題，通過在線討論形式舉行。2008自動化測試峰會將于6月5日在網(wǎng)上直播，將在歐洲、美洲和亞洲舉行，為參與者提供一個可以與專家對話（我種語言）的機會。在這五天免費的活動中，參與者可以查閱關(guān)鍵性報告，觀看技術(shù)討論，參與現(xiàn)場問答及互動活動。 Averna 研發(fā)副總裁Jean-Yves Allard說：“NI自動化測試峰會為全球觀眾帶來實時信息的同時，還涉及了與電子測試相結(jié)合的行業(yè)。作為一個參展商，我們可以在同一時間與來自四個大陸的參與者互動。技術(shù)展示外加由參展商提供的技術(shù)報告可為所有參與者提供一個很有價值的論壇信息，他們甚至都不用離開自己的桌子就能獲得這些信息?！? 來自世界范圍內(nèi)的領先的測試測量公司如：Averna, Cal-Bay, Intel, Microsoft 和Tektronix，在活動期間將分享他們的技術(shù)知識和最優(yōu)辦法。NI業(yè)務技術(shù)伙伴Mike Santori，將出席核心討論：“測試中的效率優(yōu)化”， 討論的主題包括： • 降低軟件開發(fā)成本 • 硬件設計的最新趨勢 • 測試系統(tǒng)使用壽命的延長 • 測試工程小組討論 • 參加者可在線報名或遞交報名表www.ni.com/testsummit [font=times]original text [/font] [font=times][color=#708090]Virtual Event Brings Industry-Leading Companies Together to Share Cost Reducing Strategies NEWS RELEASE – April 28, 2008 – National Instruments today announced the fifth annual Automated Test Summit, an online event featuring technical sessions focused on identifying trends and overcoming challenges in automated test. The Automated Test Summit 2008 will be hosted live on the Internet on June 5 and will be presented in the Americas, Europe and Asia, giving attendees the opportunity to speak with experts in various languages. At the free full-day event, attendees can view keynote presentations, watch technical sessions, participate in live Q&A forums and interact with vendors in the exhibition area. “The NI Automated Test Summit brings together a real-time global audience that covers every conceivable industry associated with electronics test,” said Jean-Yves Allard, vice president of research and development for Averna. “As an exhibitor, we interact live with booth visitors from four continents at the same time. The balance of technical presentations coupled with the latest offerings from the exhibitors provides a valuable forum for all participants – and they don’t even have to leave their desks.” Representatives from leading test and measurement companies worldwide such as Averna, Cal-Bay, Intel, Microsoft and Tektronix will share their technical expertise and best practices in sessions during the event. NI Business and Technology Fellow Mike Santori will present the keynote “Optimizing Efficiency in Test.” Session themes include: • Reducing software development cost • The latest trends in hardware design • Extending the life of your test system • Test engineering panel discussion Participants can register online and find a full list of technical sessions at www.ni.com/testsummit.[/color][/font]